An autofocus method for a TEM
- 31 July 2002
- journal article
- Published by Elsevier
- Vol. 21 (3) , 209-222
- https://doi.org/10.1016/0304-3991(87)90146-x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Procedures for focusing, stigmating and alignment in high resolution electron microscopyJournal of Microscopy, 1983
- An automatic focusing and astigmatism correction system for the SEM and CTEMJournal of Microscopy, 1982
- Reduction of noise in TV rate electron microscope images by digital filteringJournal of Microscopy, 1982
- Units and conventions in electron microscopy, for use in ultramicroscopyUltramicroscopy, 1980
- Coma-free alignment of high resolution electron microscopes with the aid of optical diffractogramsUltramicroscopy, 1978