Depth Profiling with Ion Induced X-Rays
- 1 January 1976
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Reaction of sputtered Pt films on GaAsJournal of Physics and Chemistry of Solids, 1975
- Ion-induced X-ray spectroscopy as a method to determine the depth distribution of trace elementsNuclear Instruments and Methods, 1975
- Effect of alloying behavior on the electrical characteristics of n-GaAs Schottky diodes metallized with W, Au, and PtApplied Physics Letters, 1973
- The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAsThin Solid Films, 1973