An analytical model of SEM and STEM charge collection images of dislocations in thin semiconductor layers: I. Minority carrier generation, diffusion, and collection
- 16 June 1981
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 65 (2) , 649-658
- https://doi.org/10.1002/pssa.2210650231
Abstract
No abstract availableKeywords
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