Sub-surface imaging by scanning thermal microscopy

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Abstract
Scanning probe thermal microscopy has been used to achieve sub-surface imaging of metallic particles embedded in a polymer matrix, using a probe which can act as both ohmic heater and thermometer. A lateral resolution of the order of a micron and a depth detection of a few microns were achieved. Together with the description of the technique and the experimental results obtained, a basic theoretical framework is presented which describes heat flow and temperature distributions within a sample consisting of inclusions buried within a bulk material. Computer models have been developed to give theoretical heat flows and temperature profiles: these are compared here with the experimental data. The theoretical lateral resolution was found to be in good agreement with the experimental observation. We show that theoretical modelling can be used to calibrate the instrument for specific investigations. For example, the technique could be used quantitatively to determine and map thermal conductivity variations across heterogeneous samples, or to determine the depth at which inclusions are located in the case where the thermal conductivities of both the inclusions and the enclosing material are known as well as the geometry of the inclusions.