Effect of substrate autodoping on MOVPE-grown ZnSxSe1-x and ZnSe: Analysis by photoluminescence (PL) and secondary ion mass spectrometry (SIMS)
- 1 January 1988
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 86 (1-4) , 629-633
- https://doi.org/10.1016/0022-0248(90)90786-k
Abstract
No abstract availableKeywords
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