Testability considerations in the design of the MC68340 Integrated Processor Unit
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 337-346
- https://doi.org/10.1109/test.1990.114040
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Testability features of the MC68332 modular microcontrollerPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Mixed-mode ATPG under input constraintsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional LogicIEEE Transactions on Computers, 1973