Characterization of thick-film resistor strain gauges on enamel steel
- 31 December 1982
- journal article
- Published by Elsevier in Sensors and Actuators
- Vol. 2, 17-27
- https://doi.org/10.1016/0250-6874(81)80025-x
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- Influence of the Substrate on the Electrical Properties of Thick-Film ResistorsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1980
- Strain sensitivity in film and cermet resistors: measured and physical quantitiesJournal of Physics D: Applied Physics, 1979
- Electrical properties and conduction mechanisms of Ru-based thick-film (cermet) resistorsJournal of Applied Physics, 1977
- Influence of the Metal Migration From Screen‐and‐Fired Terminationson the Electrical Characteristics of Thick‐Film ResistorsActive and Passive Electronic Components, 1977
- Changes in thick-film resistor values due to substrate flexureMicroelectronics Reliability, 1973