Low-frequency noise used as a lifetime test of LEDs
- 1 August 1996
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 11 (8) , 1133-1136
- https://doi.org/10.1088/0268-1242/11/8/002
Abstract
Low-frequency noise (1/f noise) has been measured in light emitting diodes (LEDs) which have been subjected to an accelerated life test by means of large forward bias current pulses. Over a large range of stress pulses the electrical and functional LED properties remain unaltered but an increase in the 1/f noise level was seen and this was correlated with the device reliability. The product `initial noise X initial rate of noise increase' correlated best with the LED lifetime.Keywords
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