Critique of (time)1/3 kinetics of defect formation in amorphous Si:H and a possible alternative model—Comment on ‘‘Kinetics of the Staebler–Wronski effect in hydrogenated amorphous silicon’’ [Appl. Phys. Lett. 4 5, 1075 (1984)]
- 23 January 1989
- journal article
- editorial
- Published by AIP Publishing in Applied Physics Letters
- Vol. 54 (4) , 398-399
- https://doi.org/10.1063/1.100974
Abstract
No abstract availableKeywords
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- Kinetics of the Staebler–Wronski effect in hydrogenated amorphous siliconApplied Physics Letters, 1984