Use of autoradiography in the study of aluminium electromigration
- 16 July 1985
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 90 (1) , 191-195
- https://doi.org/10.1002/pssa.2210900118
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Failure physics of integrated circuits — A reviewMicroelectronics Reliability, 1983
- Electromigration mechanism in aluminium conductorsSolid-State Electronics, 1980
- Grain-boundary electromigration in thin films. I. Low-temperature theoryJournal of Applied Physics, 1977
- VALUE D0Z* FOR GRAIN BOUNDARY ELECTROMIGRATION IN ALUMINUM FILMSApplied Physics Letters, 1970