Resistor matching characterization for process development using D/A converter

Publisher Website

13 November 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 219-222
https://doi.org/10.1109/icmts.2001.928665

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

Matching properties of MOS transistors
IEEE Journal of Solid-State Circuits, 1989
Characterisation and modeling of mismatch in MOS transistors for precision analog design
IEEE Journal of Solid-State Circuits, 1986