In situ study of thin film growth by internal stress measurement under ultrahigh vacuum conditions: Silver and copper under the influence of oxygen
- 1 August 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 142 (1) , 65-76
- https://doi.org/10.1016/0040-6090(86)90303-2
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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