Elemental analysis near the single-atom detection level by processing sequences of energy-filtered images
- 1 April 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 28 (1-4) , 339-346
- https://doi.org/10.1016/0304-3991(89)90321-5
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Unbiased method for signal estimation in electron energy loss spectroscopy, concentration measurements and detection limits in quantitative microanalysis: Methods and programsUltramicroscopy, 1988
- Optimum defocus for stem imaging and microanalysisUltramicroscopy, 1987
- Electron scattering in ice and organic materialsJournal of Microscopy, 1982
- About the use of electron energy-loss spectroscopy for chemical mapping of thin foils with high spatial resolutionUltramicroscopy, 1978
- The microanalysis of light elements using transmitted energy loss electronsUltramicroscopy, 1975
- New Values for the Partial Wave Electron Scattering Factor for the Elements 1≤Z≤57 and 72≤Z≤90 for Incident Electron Energies of 10, 40, 70, and 100 keVThe Journal of Chemical Physics, 1971