Analysis of Dark Currents and Minimum Detectable Powers for InGaAsP Optical Receivers
- 1 October 1981
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 20 (10)
- https://doi.org/10.1143/jjap.20.1915
Abstract
The dark current for 1.3 µm InGaAsP and In0.53Ga0.47As avalanche photodiodes was found to consist of two components: (1) a band-to-band tunneling current observed near the breakdown voltage and (2) a generation current at a lower bias voltage. An extensive estimation of the dark current for both diodes is made over a wide range of the donor density for epitaxial wafers on the basis of experimental results. Calculations of the minimum detectable power are made for InGaAsP optical receivers, including avalanche photodiodes and PIN diodes, as a function of various parameters according to the theory by Smith et al. A comparison between minimum detectable powers for avalanche photodiodes and PIN diodes reveals that for λ=1.3 µm, 1.3 µm InGaAsP avalanche photodiodes can provide a better sensitivity than In0.53Ga0.47As PIN diodes whereas for λ=1.5 µm, In0.53Ga0.47As PIN diodes can provide a sensitivity comparable to or better than In0.53Ga0.47As avalanche photodiodes.Keywords
This publication has 29 references indexed in Scilit:
- Temperature Dependence of Ionization Coefficients for InP and 1.3 µm InGaAsP Avalanche PhotodiodesJapanese Journal of Applied Physics, 1981
- Band-to-band tunnelling current in Ga 0.47 In 0.53 As p-n junctionsElectronics Letters, 1980
- Low leakage current and saturated reverse characteristic in broad-area InGaAsP diodesElectronics Letters, 1980
- p-i-n /f.e.t. hybrid optical receiver for longer-wavelength optical communication systemsElectronics Letters, 1980
- 1.3 μm InGaAsP Avalanche PhotodiodesJournal of Optical Communications, 1980
- In 0.53 Ga 0.47 As p-i-n photodiodes for long-wavelength fibre-optic systemsElectronics Letters, 1979
- InGaAsP/InP Avalanche Photodiode Prepared by Zn-DiffusionJapanese Journal of Applied Physics, 1979
- Observation of Deep Impurity Levels in In0.85GA0.15As0.39P0.61Japanese Journal of Applied Physics, 1979
- InGaAsP/InP Avalanche PhotodiodeJapanese Journal of Applied Physics, 1978
- Theory of TunnelingJournal of Applied Physics, 1961