Determination of silicon-silicon dioxide interface state properties from admittance measurements under illumination
- 1 December 1985
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 58 (11) , 4256-4266
- https://doi.org/10.1063/1.335561
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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