Submillimeter cyclotron resonance studies of inversion layers at low electron density
- 1 April 1979
- journal article
- Published by Elsevier in Journal of Magnetism and Magnetic Materials
- Vol. 11 (1) , 26-31
- https://doi.org/10.1016/0304-8853(79)90227-0
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- High-frequency magnetoconductivity in space charge layers on semiconductorsSurface Science, 1978
- Numerical study of two-dimensional Wigner glass in strong magnetic fieldsSurface Science, 1978
- Far infrared resonant magnetoabsorption in low density Si inversion layersSolid State Communications, 1977
- Temperature dependence of the magnetoconductivity in the ground Landau level in silicon inversion layersSolid State Communications, 1977
- Lineshape distortions in fir cyclotron resonance of MOS structuresSolid State Communications, 1976
- Substrate effects on the cyclotron resonance in surface layers of siliconSolid State Communications, 1975
- Cyclotron resonance of electrons in localized surface statesZeitschrift für Physik B Condensed Matter, 1975
- Cyclotron Resonance of Localized Electrons on a Si SurfacePhysical Review Letters, 1975
- Intraband Magneto-Optical Studies of Semiconductors in the Far Infrared. IIPublished by Elsevier ,1975
- Electron crystallizationAdvances in Physics, 1975