Far infrared resonant magnetoabsorption in low density Si inversion layers

This publication has 15 references indexed in Scilit:

• Lineshape distortions in fir cyclotron resonance of MOS structures
  Solid State Communications, 1976
• Contributions to Localization in the Silicon Inversion Layer from States in the Gap inSiOx
  Physical Review Letters, 1976
• Frequency dependence of cyclotron resonance in si inversion layers in the region of activated conductivity
  Surface Science, 1976
• Frequency Dependence of the Electron Conductivity in the Silicon Inversion Layer in the Metallic and Localized Regimes
  Physical Review Letters, 1975
• Temperature-Dependent Cyclotron Mass of Inversion-Layer Electrons in Si
  Physical Review Letters, 1975
• Frequency-Dependent Cyclotron Effective Masses in Si Inversion Layers
  Physical Review Letters, 1975
• Cyclotron Resonance of Localized Electrons on a Si Surface
  Physical Review Letters, 1975
• Substrate Bias Effects on Electron Mobility in Silicon Inversion Layers at Low Temperatures
  Physical Review Letters, 1975
• Disorder-induced carrier localization in silicon surface inversion layers
  Applied Physics Letters, 1974
• Electron-Electron Interactions Continuously Variable in the Range2.1>rs>0.9
  Physical Review Letters, 1972