Auger electron diffraction from NiO(100) layers on Ag(100)
- 20 June 1996
- journal article
- Published by Elsevier in Surface Science
- Vol. 357-358, 233-237
- https://doi.org/10.1016/0039-6028(96)00099-4
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Influence of spherical wave corrections on the temperature dependence of XAFS multiple scattering processesPhysica B: Condensed Matter, 1995
- A comparison of low-Z EXAFS experiment and ab initio calculationsJournal of Physics: Condensed Matter, 1993
- Elastic and inelastic contributions to the XPS photoelectron diffraction patterns of Ni(100) and NiO(100)Surface Science, 1993
- Growth of ordered thin films of NiO on Ag(100) and Au(111)Surface Science, 1993
- Effects of Organometallic Compounds Introduced to Plasma on Diamond SynthesisJapanese Journal of Applied Physics, 1993
- Raman Scattering of Gas-Evaporated Ge with a Structure Other Than the Diamond LatticeJapanese Journal of Applied Physics, 1993
- The structure of thin NiO(100) films grown on Ni(100) as determined by low-energy-electron diffraction and scanning tunneling microscopySurface Science, 1991
- Observation and characterization of a strained lateral superlattice in the oxidation of Ni(001)Physical Review B, 1989
- Angle-resolved x-ray photoelectron spectroscopyProgress in Surface Science, 1984
- New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine StructurePhysical Review Letters, 1971