An investigation of inversion layer induced leakage current in abrupt p-n junctions
- 1 August 1970
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 13 (8) , 1167-1174
- https://doi.org/10.1016/0038-1101(70)90127-9
Abstract
No abstract availableKeywords
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