Source/drain contact resistance of silicided thin-film SOI MOSFET's
- 1 June 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 41 (6) , 1007-1012
- https://doi.org/10.1109/16.293314
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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