Estimating variation in IC yield estimates
- 1 April 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 21 (2) , 362-365
- https://doi.org/10.1109/jssc.1986.1052528
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributionsIBM Journal of Research and Development, 1985
- Integrated circuit yield statisticsProceedings of the IEEE, 1983
- A simple method for modeling VLSI yieldsSolid-State Electronics, 1982
- Comments on “some considerations in the formulation of IC yield statistics”Solid-State Electronics, 1981
- Modification of Poisson statistics: modeling defects induced by diffusionIEEE Journal of Solid-State Circuits, 1977
- On a composite model to the IC yield problemIEEE Journal of Solid-State Circuits, 1975
- Applying a composite model to the IC yield problemIEEE Journal of Solid-State Circuits, 1974
- Defect density distribution for LSI yield calculationsIEEE Transactions on Electron Devices, 1973
- Design Considerations for Integrated Electronic DevicesProceedings of the IRE, 1960