Analysis of the interaction of an electron beam with back surface field solar cells

1 July 1983

journal article
research article
Published by AIP Publishing in Journal of Applied Physics

Vol. 54 (7) , 3938-3942
https://doi.org/10.1063/1.332569

Abstract

In this paper the short circuit current I_SC induced by the electron beam of a scanning electron microscope in a back surface field solar cell will be determined theoretically. It will be shown that, in a configuration used previously for solar cells with an ohmic back surface, the I_SC gives a convenient means for estimating the back surface recombination velocities and thus the quality of back surface field cells. Numerical data will be presented applicable to a point source model for the electron–hole pair generation.

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