Component failures based on flaw distributions
- 1 January 1989
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A discussion is presented of a model based on the assumption that all failures basically are due to wearout. The only real difference between long-term wearout and the failures that occur in early life and during the useful life period will be in the size of the inherent flaws or defects in the components. Large flaws connect with early life failures, small flaws connect with end-of-life-failures. The model takes several competing failure mechanisms into account. Examples and case studies are used to provide substance to the model.<>Keywords
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