Selection of a Laser Reliability Assurance Strategy for a Long-Life Application
- 1 March 1985
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in AT&T Technical Journal
- Vol. 64 (3) , 671-715
- https://doi.org/10.1002/j.1538-7305.1985.tb00445.x
Abstract
We are concerned with assuring the reliability of semiconductor lasers intended for an application in which the design lifetime is long, replacement or redundancy is impossible or impractical, and the failure of even a few lasers could be disastrous....Keywords
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