A three-valued fast fault simulator for scan-based VLSI-logic
- 7 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- A reconvergent fanout analysis for efficient exact fault simulation of combinational circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
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