Reliability evaluation of k-out-of-n redundant system with partially energized stand-by units
- 1 March 1996
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 36 (3) , 379-383
- https://doi.org/10.1016/0026-2714(95)00074-7
Abstract
No abstract availableKeywords
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