Transport mechanisms for Mg/Zn3P2 junctions

Abstract
The dominant transport mechanisms for Mg/Zn3P2 junctions are shown to depend on the heat treatment in hydrogen of the Zn3P2 prior to Mg deposition. For heat treatments below 300 °C, multistep tunneling via defect centers dominates, whereas for heat treatments between 300 and 500 °C, recombination/generation dominates. Correspondence is observed between the imperfections responsible for the junction transport and previously reported imperfections in bulk Zn3P2 crystals. Enhanced tunneling under solar illumination contributes to the low energy conversion efficiency of thin Mg film Mg/Zn3P2 devices. An estimate of the interface recombination velocity for these junctions yields a value of 1.9×107 cm/sec.

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