Evaluation of Intermittent Contact Mode AFM Probes by HREM and Using Atomically Sharp CeO2 Ridges as Tip Characterizer
- 22 June 2000
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 16 (15) , 6267-6277
- https://doi.org/10.1021/la000078t
Abstract
No abstract availableThis publication has 61 references indexed in Scilit:
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