GaAs reflection photocathodes grown by metal alkyl vapor phase epitaxy

Abstract
GaAs reflection photocathodes grown by vapor‐phase epitaxy using trimethyl gallium and arsine have been activated to a maximum sensitivity of 1150 μA 1m−1. The material is of high quality and has diffusion lengths and surface escape probabilities which are comparable with those measured for liquid‐phase epitaxial material.