Thin target thickness measurement by photon induced x-ray fluorescence
- 1 January 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 140 (1) , 205-209
- https://doi.org/10.1016/0029-554x(77)90089-1
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samplesNuclear Instruments and Methods, 1973
- X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition ProbabilitiesReviews of Modern Physics, 1972
- Microanalysis of Materials by Backscattering SpectrometryScience, 1972
- High Rate X-Ray Fluorescence Analysis by Pulsed ExcitationIEEE Transactions on Nuclear Science, 1972