Design and Application of Self-Testing Comparators Implemented with MOS PLA's
- 1 June 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-33 (6) , 493-506
- https://doi.org/10.1109/tc.1984.1676473
Abstract
A high probability of detecting errors caused by hardware faults is an essential property of any fault-tolerant system. VLSI technology makes the use of duplication and matching for error detection practical and attractive. A critical circuit in this context is a self-testing comparator. Faults in the comparator must be detected so that they do not mask discrepancies between the duplicated modules.Keywords
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