Limitations, innovations, and challenges of circuits and devices into a half micrometer and beyond
- 1 April 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 27 (4) , 465-472
- https://doi.org/10.1109/4.126533
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
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