High Power Density Thin Film Resistors
- 1 December 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Parts, Hybrids, and Packaging
- Vol. 11 (4) , 273-281
- https://doi.org/10.1109/tphp.1975.1135076
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Flight quality nickel-chromium films with sheet resistances up to 420 ohms per squareMicroelectronics Reliability, 1975
- Nickel-chromium resistor failure modes and their identificationMicroelectronics Reliability, 1973
- Stability of Nickel-Chromium Thin Film ResistorsIEEE Transactions on Parts, Hybrids, and Packaging, 1972
- Observations on the Reliability of thin Film Nickel-Chromium Resisiors8th Reliability Physics Symposium, 1970
- Electromigration—A brief survey and some recent resultsIEEE Transactions on Electron Devices, 1969
- Temperature and other charadscteristics of thin-film nichrome resistors on various substrate materialsProceedings of the IEEE, 1963