Depth profile analysis of surfaces produced by annealing ultra-thin films of Au deposited on Si(100)
- 10 November 1996
- journal article
- Published by Elsevier in Surface Science
- Vol. 367 (1) , 45-55
- https://doi.org/10.1016/s0039-6028(96)00862-x
Abstract
No abstract availableKeywords
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