Reflection high-energy electron diffraction intensity oscillation recorder for molecular-beam epitaxy systems
- 1 February 1990
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 61 (2) , 917-918
- https://doi.org/10.1063/1.1141463
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The dependence of RHEED oscillations on MBE growth parametersJournal of Vacuum Science & Technology B, 1985
- Dynamic RHEED observations of the MBE growth of GaAsApplied Physics A, 1984
- Damped oscillations in reflection high energy electron diffraction during GaAs MBEJournal of Vacuum Science & Technology B, 1983
- Dynamics of film growth of GaAs by MBE from Rheed observationsApplied Physics A, 1983
- Comments on “red intensity oscillations during MBE of GaAs”Surface Science Letters, 1981
- Oscillations in the surface structure of Sn-doped GaAs during growth by MBESurface Science, 1981