Surface-state generation on MOS capacitors irradiated with UV light and electrons

This publication has 15 references indexed in Scilit:

• Illumination with Ultraviolet Light of MOS Capacitors
  Physica Status Solidi (a), 1974
• Photoemission studies at RT of X-irradiated MOS structures
  Physica Status Solidi (a), 1972
• Vacuum Ultraviolet Radiation Effects in SiO2
  IEEE Transactions on Nuclear Science, 1971
• Photoresponses of MOS transistor
  Proceedings of the IEEE, 1971
• Evolution de la distribution des etats d'interface dans des structures mos irradiees aux electrons et soumises a l'effet d'un traitement thermique sous champ
  Solid State Communications, 1970
• Distribution energetique des etats de surface a l'interface SiSiO2 effet de differents traitements
  Solid State Communications, 1970
• Interface Barrier Energy Determination from Voltage Dependence of Photoinjected Currents
  Journal of Applied Physics, 1970
• Characteristics of Fast Surface States Associated with SiO[sub 2]-Si and Si[sub 3]N[sub 4]-SiO[sub 2]-Si Structures
  Journal of the Electrochemical Society, 1969
• Effects of ionizing radiation on oxidized silicon surfaces and planar devices
  Proceedings of the IEEE, 1967
• Irradiation of MIS Capacitors with High Energy Electrons
  IEEE Transactions on Nuclear Science, 1966