Negative bias temperature instability: What do we understand?
Top Cited Papers
- 1 June 2007
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 47 (6) , 841-852
- https://doi.org/10.1016/j.microrel.2006.10.006
Abstract
No abstract availableThis publication has 37 references indexed in Scilit:
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