ScanBist A Multi-frequency Scan-Based BIST Method

This publication has 8 references indexed in Scilit:

• Hardware-based weighted random pattern generation for boundary scan
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Fault detection effectiveness of weighted random patterns
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Empirical failure analysis and validation of fault models in CMOS VLSI
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A new procedure for weighted random built-in self-test
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Fault detection and diagnosis based on signature analysis
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1991
• A scan-based BIST technique using pair-wise compare of identical components
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1991
• Cellular automata-based pseudorandom number generators for built-in self-test
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
• Accelerated transition fault simulation
  Published by Association for Computing Machinery (ACM) ,1987