New normalization procedure for modulation spectroscopy
- 1 August 1987
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 58 (8) , 1429-1432
- https://doi.org/10.1063/1.1139427
Abstract
We report a new type of normalization procedure for modulation spectroscopy experiments in order to obtain the relative change in the reflectance (transmittance) spectrum ΔR/R(ΔT/T). Our new technique utilizes a servomechanism driven variable neutral density filter which keeps the dc component of the signal from the detector constant by varying the intensity of the light striking the sample. This method is particularly useful for photoreflectance measurements which can have background problems due to scattered pump light and/or photoluminescence. Advantages for other modulation spectroscopies, particularly in the region of the fundamental band gap of semiconductors, also will be discussed.Keywords
This publication has 23 references indexed in Scilit:
- Electroreflectance spectroscopy of Si-quantum-well structuresPhysical Review B, 1986
- Modulated-reflectance spectroscopy of InP doping superlatticesPhysical Review B, 1986
- Photoreflectance study of GaAs/AlAs superlattices: Fit to electromodulation theoryApplied Physics Letters, 1986
- Electroreflection Measurements on Semiconductor/Electrolyte Interfaces to Determine the Voltage DistributionJournal of the Electrochemical Society, 1985
- Photoreflectance characterization of interband transitions in GaAs/AlGaAs multiple quantum wells and modulation-doped heterojunctionsApplied Physics Letters, 1985
- Comparative Study of Defects in Semiconductors by Electrolyte Electroreflectance and Spectroscopic EllipsometryPhysical Review Letters, 1984
- Excitonic Absorption Spectra of GaAs–AlAs Superlattice at High TemperatureJapanese Journal of Applied Physics, 1984
- Pseudo‐Exciton Effect in the Schottky‐Barrier ElectroreflectancePhysica Status Solidi (b), 1982
- Photoreflectance Line Shape at the Fundamental Edge in Ultrapure GaAsPhysical Review B, 1970
- High-Sensitivity PiezoreflectivityPhysical Review Letters, 1965