Structural study of in situ grown Te/GaAs(001) interfaces by grazing incidence X-ray diffraction
- 1 July 1991
- journal article
- Published by Elsevier in Surface Science
- Vol. 251-252, 478-482
- https://doi.org/10.1016/0039-6028(91)91038-y
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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