Built-In Testing of One-Dimensional Unilateral Iterative Arrays

1 June 1984

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-33 (6) , 560-564
https://doi.org/10.1109/tc.1984.1676481

Abstract

It has been shown in the literature that C-testable iterative arrays have very simple test structures, independent of the length of the arrays. We show in this work that all C-testable arrays are also pI-testable, which is a property yielding, in many cases, rather simple built-in-testing structures, both for the test generator and for the response verifier.

Keywords

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