Off Line, Built-in Test Techniques for VLSI Circuits

This publication has 15 references indexed in Scilit:

• A logic design structure for LSI testability
  Published by Association for Computing Machinery (ACM) ,1988
• Design for autonomous test
  IEEE Transactions on Circuits and Systems, 1981
• LSI logic testing — An overview
  IEEE Transactions on Computers, 1981
• Built-in test for complex digital integrated circuits
  IEEE Journal of Solid-State Circuits, 1980
• Self-Testing Computers
  Computer, 1979
• Transition Count Testing of Combinational Logic Circuits
  IEEE Transactions on Computers, 1976
• Diagnosis & Reliable Design of Digital Systems
  Published by Springer Nature ,1976
• Design of a Self-Checking Microprogram Control
  IEEE Transactions on Computers, 1973
• Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
  IEEE Transactions on Computers, 1973
• A New Representation for Faults in Combinational Digital Circuits
  IEEE Transactions on Computers, 1972