Electroreflectance Measurements on Si, Ge, and Sn
- 15 December 1968
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 176 (3) , 905-908
- https://doi.org/10.1103/physrev.176.905
Abstract
The room-temperature electroreflectance spectra of the II-VI compounds Si, Ge, and Sn are reported in the energy region 1.5-4.5 eV. All measurements were performed using the electrolyte technique with a nonaqueous electrolyte. These materials crystallize with the antifluorite crystal structure and are small-band-gap semiconductors. In all of the materials, a large number of sharp peaks were observed; the spectra are interpreted in terms of the reflectivity spectra and existing energy-band calculations. Special mention should be made of a doublet observed (1.64-1.84 eV) in the spectrum of Ge. This doublet appears to be due to the spin-orbit splitting of the valence band.
Keywords
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