Investigations of Nd:YAG laser formed connections and disconnections of standard CMOS double level metallizations

This publication has 9 references indexed in Scilit:

• Simulation and test of faults in WSI interconnect systems
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• On the optimization of hierarchical redundancies including configuration nets and switches
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Design for testability for wafer-scale integration interconnect systems design and test methodology
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Power distribution strategies based on current estimation and simulation of lossy transmission lines in conjunction with power isolation circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Architecture Of A Programmable Real-Time Processor For Digital Video Signals Adapted To Motion Estimation Algorithms
  Published by SPIE-Intl Soc Optical Eng ,1988
• Future trends in wafer scale integration
  Proceedings of the IEEE, 1986
• Laser programmed vias for restructurable VLSI
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1980
• Experimental study of laser formed connections for LSI wafer personalization
  IEEE Journal of Solid-State Circuits, 1975
• Connections and disconnections on integrated circuits using nanosecond laser pulses
  Applied Physics Letters, 1975