Electric potential and current distribution in a rectangular sample of anisotropic material with application to the measurement of the principal resistivities by an extension of van der Pauw's method
- 31 July 1973
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 16 (7) , 753-762
- https://doi.org/10.1016/0038-1101(73)90171-8
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Theory of the four-point probe technique as applied to the measurement of the conductivity of thin layers on conducting substratesBritish Journal of Applied Physics, 1966
- Potential distribution in a rectangular semiconductor bar for use with four-point probe measurementsSolid-State Electronics, 1964
- The geometric factor in semiconductor four-probe resistivity measurementsSolid-State Electronics, 1963
- Measurement of the Resistivity Constants of Anistotropic Conductors by means of Plane-Parallel Discs of Arbitrary Shape†Journal of Electronics and Control, 1959
- Measurement of Sheet Resistivities with the Four-Point ProbeBell System Technical Journal, 1958