Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy
- 1 January 2000
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 359 (2) , 244-250
- https://doi.org/10.1016/s0040-6090(99)00882-2
Abstract
No abstract availableThis publication has 35 references indexed in Scilit:
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