Quantitative characterization of AlAs/GaAs interfaces by high-resolution transmission electron microscopy along the ?100? and the ?110? projection
- 1 November 1993
- journal article
- Published by Springer Nature in Applied Physics A
- Vol. 57 (5) , 393-400
- https://doi.org/10.1007/bf00331777
Abstract
No abstract availableKeywords
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