New methods for qualitative and quantitative analysis of the GaAs/AlGaAs interface by high-resolution electron microscopy
- 31 December 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 38 (3-4) , 265-289
- https://doi.org/10.1016/0304-3991(91)90161-x
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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