Dynamic force microscopy across steps on the Si(111)-(7×7) surface
- 1 August 2000
- journal article
- Published by Elsevier in Surface Science
- Vol. 461 (1-3) , 255-265
- https://doi.org/10.1016/s0039-6028(00)00592-6
Abstract
No abstract availableKeywords
This publication has 38 references indexed in Scilit:
- Site discrimination of adatoms in Si(111)-7 × 7 by noncontact atomic force microscopySurface Science, 1997
- Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7×7Physical Review B, 1996
- Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact modeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7Zeitschrift für Physik B Condensed Matter, 1996
- Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force MicroscopyScience, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force MicroscopyJapanese Journal of Applied Physics, 1995
- True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive ForcesScience, 1993
- Site-dependent electronic effects, forces, and deformations in scanning tunneling microscopy of flat metal surfacesPhysical Review B, 1990
- Atomic Force MicroscopePhysical Review Letters, 1986