Thin‐film characterization by x‐ray fluorescence

This publication has 11 references indexed in Scilit:

• Quantitative X-ray fluorescence analysis of single-layer and multilayer thin films
  Thin Solid Films, 1988
• Simultaneous Determination of the Thickness and Composition of Thin Film Samples using Fundamental Parameters
  Published by Springer Nature ,1988
• X-ray fluorescence analysis of multiple-layer films
  Analytica Chimica Acta, 1986
• Lama III — A Computer Program for Quantitative XRFA of Bulk Specimens and Thin Film Layers
  Published by Springer Nature ,1984
• Quantitative X‐ray fluorescence analysis of thin films using LAMA‐2
  X-Ray Spectrometry, 1981
• Characterization of Thin Films by X-Ray Fluorescence and Diffraction Analysis
  Published by Springer Nature ,1979
• Simultaneous determination of composition and mass thickness of thin films by quantitative x-ray fluorescence analysis
  Analytical Chemistry, 1977
• Lama I — A General Fortran Program for Quantitative X-ray Fluorescence Analysis
  Published by Springer Nature ,1977
• Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-Rays
  Published by Springer Nature ,1969
• Calculation methods for fluorescent x-ray spectrometry. Empirical coefficients versus fundamental parameters
  Analytical Chemistry, 1968